Portable eddy current flaw detector Eddycon CL

The EDDYCON CL eddy current flaw detector is intended for:

Detection of surface cracks in various parts.

Finding of cracks in holes and multi-layered structures with the help of rotary scanners.

Recognition of sub-surface flaws in non-magnetic conductive materials.

Evaluation of non-magnetic material conductivity and paint coating thickness.

Eddycon CL benefits:

  • Easy-to-operate due to user-friendly intuitive interface.
  • Light and sound alarms.
  • Strict compliance with ISO 15548.
  • Tune-out from the influence of working gap and inhomogeneity of electromagnetic properties.
  • Saving over 1000 settings and test results to the flaw detector memory.
  • Data communication to PC via USB flash drive or Ethernet.
  • Specialty software for viewing test results and printing out test reports.
  • Software upgrade using USB flash drives.
  • Evaluation of flaw depth.
  • Review of saved defectograms on the display of eddy current flaw detector.
  • Quick-release Li-Ion battery for continuous 7-hour operation.
  • Lightweight – up to 3.7 lbs (1.7 kg).
  • Classical model of a flaw detector

Due to the rubber corners and folding handle it can be safely placed both on a table and on various test objects. It even can be hanged if necessary. Still, Eddycon CL can be used as portable being fixed with straps on the operator’s chest.

Portable eddy-current flaw detector Eddycon C
Portable eddy-current flaw detector Eddycon CL screen
Portable eddy-current flaw detector Eddycon CL screen
  • Display

7.2″ TFT color display with 800×480 pixels resolution ensures a high-definition picture on the screen. The screen has several display modes such as light, dark, standard.

Specialized application-dependent software of the Eddycon CL multipurpose eddy current flaw detector serves for processing test results, as well as generating and printing out test reports. The software program allows working with the data saved on PC.

Main advantages of the program are as follows:

  • Intuitive user-friendly interface.
  • Easy viewing of test results for each frequency mode (Frequency No. 1, Frequency No.2 & Mix).
  • Generation and storage of electronic reports.
  • Data output for each detected flaw, namely:
    • flaw location coordinate on a defectogram (if using an encoder);
    • signal amplitude and phase;
    • flaw depth.

The resulting electronic report contains all basic data on test performed, such as:

  • Company name, NDT department and inspector who performed the test.
  • Description of a test object.
  • All setting parameters of the instrument at the time of testing.
  • Parameters of signals coming from defects (amplitude, phase, depth).
  • Representation of the signals from defects in a complex plane or strip chart.
  • Inspection date.
  • Possibility to create reports of other types, when approved by the customer.
Overall dimensions 10″ × 6.1″ × 3.1″ (256 mm × 156 mm × 80 mm)
Weight up to 3.7 lbs (1.7 kg)
Applicable standards СЕ, ISO 15548
Supply mains 100 V to 240 V, 50 Hz – 60 Hz
Inputs & outputs 2.0 USB-port (hub), Ethernet (Lemo 4-way), headphones (Lemo 4-way)
Keypad American, International (icons)
Operation conditions
Operation temperature -4 to +122° F (-20 to +50°C)
Storage temperature -4 to +122° F (-20 to +50°C)
IP rating IP 64
Type Li-Ion 12V/4500 mA·h
Operation time Normal mode — up to 7 hours; If using rotary scanners — 4 to 5 hours
Display size 7.2″
Type Color TFT (800×480 pixels)
Display modes Normal, full-screen; three color schemes
Grid Three types: coarse, fine, polar
Connectivity and data storage
PC software Test results processing program
Data storage MicroSD 4 Gb internal memory card (up to 64 Gb as an option);
ET specifications
Frequency range 10 Hz to 16 MHz
Gain 70 dB
Probe supply voltage 0.5 V; 1V; 2V; 4V; 6V
Additional gain 30 dB
Phase rotation 0 to 359.9
Digital scale 1/16 to 16, with a step of 6 dB
Test frequency 1 to 11 kHz
Signal indication time 0.1 s; 0.3 s; 0.5 s; 1 s; 2 s; 3 s; 4 s; 5 s; 8 s
Filter Low-pass: 1 to 5 000 Hz
High-pass: 1 to 5 000 Hz
Connected probes Single, Reflection, Bridge
Probe connector Lemo 00, Lemo 12-way / Lemo 16-way
Signal display modes Complex plane – X(y);
Time base – X(t), Y(t);
Dual-frequency mode
Threshold level types Circle, Threshold, Sector, Trapezium
Multi-frequency operation Dual-frequency multiplexing;
Independent control of both frequencies;
Mix of two frequencies (F1 – F2, F1 + F2)

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